Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect moisture soldering heat
€269.00
DC or AC supplied electronic controlgear for LED modules - Performance requirements
€70.00
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : Résistances des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de brasage
€126.10
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
€183.00
Semiconductor devices Microwave integrated circuits. Oscillators
€355.00
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
€369.00
Semiconductor devices Optoelectronic devices. Photocouplers
€374.00
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing of non-volatile memory devices
Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
€0.00
Semiconductor devices - Mechanical and climatic test methods - Part 15 : resistance to soldering temperature for through-hole mounted devices
€77.96
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
€59.50
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
€95.67
Semiconductor devices - Mechanical and climatic test methods - Part 41 : standard reliability testing methods of non-volatile memory devices
€111.96
