Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level
€165.00
Specification for capability approval of light emitting and infra-red diode arrays of assessed quality: generic data and methods of test
€269.00
Semiconductor devices Mechanical and climatic test methods
€316.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated bipolar transistors for low and high frequency amplification
€193.00
Semiconductor devices. Discrete devices Recommendations for signal (including switching) and regulator diodes
€355.00
Mechanical standardization of semiconductor devices Recommendations for the preparation drawings
Mechanical standardization of semiconductor devices Recommendations for the preparation outline drawings integrated circuits
Mechanical standardization of semiconductor devices Recommendations for a coding system and classification into forms package outlines
Mechanical standardization of semiconductor devices Recommendations for tape automated bonding (TAB) integrated circuits
Mechanical standardization of semiconductor devices Specification for the preparation outline drawings surface mounted device packages
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bipolar transistors for switching applications
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
Mechanical standardization of semiconductor devices Schedule UK national drawings giving dimensions
€404.00
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Ambient-rated bipolar transistors for low and high-frequency amplification
