Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 6: Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
€176.00
Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
Semiconductor devices - Mechanical and climatic test methods - Part 20-1: Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
€325.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
€269.00
Semiconductor devices bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
Semiconductor devices - Part 18-1: Semiconductor bio sensors - Test method and data analysis for calibration of lens-free CMOS photonic array sensors
€231.00
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
€165.00
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification
Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
€286.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films
Semiconductor devices - Mechanical and climatic test methods - Part 17 : neutron irradiation
€77.96
Semiconductor devices - Mechanical and climatic test methods - Part 18 : Ionizing radiation (total dose)
€111.96
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, threshold voltage of flexible
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
€193.00
