BS EN IEC 63550-3 Semiconductor devices. Neuromorphic devices Part 3. Evaluation method of spike dependent plasticity in memristor
€23.00
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
Hand-held motor-operated electric tools. Safety Particular requirements for sanders and polishers other than disk type
€193.00
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
€316.00
Self-ballasted LED-lamps for general lighting services. Performance requirements
Semiconductor optoelectronic devices for fibre optic system applications Specification template essential ratings and characteristics
Thyristor valves for high-voltage direct current (HVDC) power transmission Electrical testing
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on thermoreflectance
€269.00
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of bending strength microstructures
Semiconductor devices Magnetic and capacitive coupler for basic reinforced insulation
Semiconductor devices - Micro-electromechanical Part 52: Biaxial tensile testing method for stretchable MEMS
Draft BS EN 63567-4 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 4. Evaluation methods for dimensional accuracy laser dicing process
Thermal standardization on semiconductor packages circuit simulation models of discrete for transient analysis
Semiconductor devices. Mechanical and climatic test methods Solderability
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
