Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
€269.00
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
€193.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 2: Evaluation method for electron mobility, sub-threshold swing and threshold voltage of flexible devices
€44.00
Self-ballasted LED lamps for general lighting services with supply voltages > 50 V. Performance requirements
€374.00
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
€176.00
Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer
€88.00
Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
Semiconductor devices - Micro-electromechanical devices - Part 31: Four-point bending test method for interfacial adhesion energy of layered MEMS materials
Semiconductor devices - Micro-electromechanical devices - Part 36: Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for characterizing the barrier performance of thin film encapsulation flexible organic
Semiconductor devices. devices for energy harvesting and generation Test evaluation methods flexible piezoelectric
€316.00
Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
