31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
IEC 62779-4:2020

IEC 62779-4:2020

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Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope

€127.00

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DIN EN IEC 60749-18:2020-02

DIN EN IEC 60749-18:2020-02

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Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2019); German version EN IEC 60749-18:2019.

€111.40

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BS IEC 60747-18-3:2019

BS IEC 60747-18-3:2019

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Semiconductor devices bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

€269.00

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BS IEC 60747-5-9:2019

BS IEC 60747-5-9:2019

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on temperature-dependent electroluminescence

€193.00

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BS IEC 60747-5-10:2019

BS IEC 60747-5-10:2019

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on room-temperature reference point

€193.00

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BS IEC 60747-5-11:2019

BS IEC 60747-5-11:2019

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents light diodes

€193.00

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VDA EOS-Electrical Overstress in der Automobilindustrie:2020

VDA EOS-Electrical Overstress in der Automobilindustrie:2020

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EOS-Electrical Overstress in the Automotive Industry, Dealing with semiconductor devices showing a signature of electrial overstress, Contents, documentations and explanations 1st Edition, January 2020

€46.25

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IEC 60747-5-11:2019

IEC 60747-5-11:2019

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Semiconductor devices - Part 5-11: Optoelectronic devices - Light emitting diodes - Test method of radiative and nonradiative currents of light emitting diodes

€88.00

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IEC 60747-18-3:2019

IEC 60747-18-3:2019

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Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

€176.00

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IEC 60747-5-9:2019

IEC 60747-5-9:2019

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Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

€127.00

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IEC 60747-5-10:2019

IEC 60747-5-10:2019

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Semiconductor devices - Part 5-10: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the room-temperature reference point

€88.00

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PR NF EN IEC 61643-322, C61-743-322PR (12/2019)

PR NF EN IEC 61643-322, C61-743-322PR (12/2019)

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Composants pour parafoudres basse tension - Partie 322 : Principes de sélection et d'application pour les limiteurs de tension à jonction PN de semiconducteurs silicium

€125.23

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BS IEC 60747-19-1:2019

BS IEC 60747-19-1:2019

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Semiconductor devices Smart sensors. Control scheme of smart sensors

€269.00

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BS IEC 60747-5-8:2019

BS IEC 60747-5-8:2019

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Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies light diodes

€193.00

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BS IEC 60747-9:2019

BS IEC 60747-9:2019

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Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)

€404.00

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