Semiconductor devices - Flexible and stretchable semiconductor devices - Part 4: Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
€88.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 5: Test method for thermal characteristics of flexible materials
€127.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 7: Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices
€286.00
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection
€269.00
IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects
€176.00
IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
€193.00
Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
Amendment 2 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€11.00
International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
€23.00
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
BS EN 61643-321. Components for low-voltage surge protective devices Part 321. Performance requirements and test circuits silicon PN-junction voltage limiters
