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IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
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Summary
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/27/2020 |
| Release Date | 05/27/2020 |
| Edition | 1 |
| Page Count | 15 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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