Mechanical standardization of semiconductor devices - Part 6-18: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for ball grid array (BGA)
€127.00
Mechanical standardization of semiconductor devices - Part 6-19: Measurement methods of package warpage at elevated temperature and the maximum permissible warpage
€176.00
Semiconductor devices. Discrete devices Insulated-gate bipolar transistors (IGBTs)
€374.00
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 47/1916/CDV:2007); German version prEN 60749-20:2007
€105.42
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
€369.00
Semiconductor devices - Discrete devices - Part 9: Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 47/1900/CD:2007)
€91.03
Mechanical standardization of semiconductor devices General rules for the preparation outline drawings discrete
€316.00
Mechanical standardization of semiconductor devices - Part 6-13: Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array and Fine-pitch Land Grid Array (FBGA/FLGA)
€88.00
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 47E/322/CD:2007)
€122.34
Mechanical standardization of semiconductor devices - Part 1: General rules for the preparation of outline drawings of discrete devices
€286.00
Test method for measuring whisker growth on tin and tin alloy surface finishes
€269.00
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006); German version EN 60749-27:2006.
€77.20
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity water solubility in organic materials used for semiconductor components
€165.00
Semiconductor devices - Mechanical and climatic test methods - Part 39 : measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components - Dispositifs à semiconducteurs
€59.33
