31.080.01 : Semiconductor devices in general

IEC 60191-2X:1999/COR1:2000

IEC 60191-2X:1999/COR1:2000

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IEC 60191-2X:1999/COR1:2000 Corrigendum 1 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2Y:2000

IEC 60191-2Y:2000

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IEC 60191-2Y:2000 Twenty-third supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2Z:2000

IEC 60191-2Z:2000

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IEC 60191-2Z:2000 Twenty-fourth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2:1966/AMD1:2001

IEC 60191-2:1966/AMD1:2001

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IEC 60191-2:1966/AMD1:2001 Amendment 1 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2:1966/AMD2:2001

IEC 60191-2:1966/AMD2:2001

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IEC 60191-2:1966/AMD2:2001 Amendment 2 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2:1966/AMD3:2001

IEC 60191-2:1966/AMD3:2001

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IEC 60191-2:1966/AMD3:2001 Amendment 3 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2:1966/AMD4:2001

IEC 60191-2:1966/AMD4:2001

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IEC 60191-2:1966/AMD4:2001 Amendment 4 - Mechanical standardization of semiconductor devices - Part 2: Dimensions

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IEC 60191-2:1966/AMD5:2002

IEC 60191-2:1966/AMD5:2002

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IEC 60191-2:1966/AMD5:2002 Amendment 5 - Mechanical standardization of semiconductor devices. Part 2: Dimensions

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IEC 60749-10:2002

IEC 60749-10:2002

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IEC 60749-10:2002 Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

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IEC 60749-2:2002

IEC 60749-2:2002

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IEC 60749-2:2002 Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

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IEC 60749-11:2002

IEC 60749-11:2002

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IEC 60749-11:2002 Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

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IEC 60191-2:1966/AMD6:2002

IEC 60191-2:1966/AMD6:2002

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IEC 60191-2:1966/AMD6:2002 Amendment 6 - Mechanical standardization of semiconductor devices. Part 2: Dimensions

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IEC 60191-2:1966/AMD7:2002

IEC 60191-2:1966/AMD7:2002

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IEC 60191-2:1966/AMD7:2002 Amendment 7 - Mechanical standardization of semiconductor devices. Part 2: Dimensions

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UTE C96-011, C96-011U (08/1989)

UTE C96-011, C96-011U (08/1989)

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Composants électroniques - Dispositifs à semiconducteurs - Onzième partie : spécification intermédiaire pour les dispositifs discrets

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UTE C96-010, C96-010U (08/1989)

UTE C96-010, C96-010U (08/1989)

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Composants électroniques - Dispositifs à semiconducteurs - Dixième partie : spécification générique pour les dispositifs discrets et les circuits intégrés

€101.00

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