Dispositifs à semiconducteurs - Partie 15 : dispositifs à semiconducteurs de puissance isolée
€150.67
Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for non-hermetic encapsulated electronic components (IEC 47/1769/CD:2004)
€98.32
Semiconductors Product - Discontinuance notification for semiconductors (IEC 47/1777A/CDV:2004)
€41.78
Specification for safety of household and similar electrical appliances Particular requirements tumble dryers
€193.00
Board level drop test method of components for handheld electronic products
€127.00
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004); German version EN 60749-23:2004.
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004.
€69.91
Mechanical standardization of semiconductor devices - Part 6: General rules for the preparation of outline drawings of surface mounted semiconductor device packages
€286.00
Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)
€91.03
System tests for high-voltage direct current (HVDC) installations
€473.00
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
€404.00
IEC TR 62380:2004 Reliability data handbook - Universal model for reliability prediction of electronics components, PCBs and equipment
€418.00
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2003); German version EN 60747-15:2004.
€140.00
Microelectromechanical devices - Part 2: Tensile testing method of thin film materials (IEC 47/1759/CD:2004)
Microelectromechanical devices - Part 3: Thin film standard test piece (IEC 47/1760/CD:2004)
