31.080.01 : Semiconductor devices in general

IEC 60749-34:2004

IEC 60749-34:2004

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling

€44.00

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IEC 60749-24:2004

IEC 60749-24:2004

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST

€44.00

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IEC 60749-23:2004

IEC 60749-23:2004

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

€44.00

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DIN EN 60749-20:2003-12

DIN EN 60749-20:2003-12

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat (IEC 60749-20:2002 + Corr. 1:2003); German version EN 60749-20:2003.

€98.32

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DIN EN 60749-32:2003-12

DIN EN 60749-32:2003-12

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced) (IEC 60749-32:2003 + Corr. 1:2003); German version EN 60749-32:2003 + Corr.:2003.

€41.78

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UNE-EN 60749-18:2003

UNE-EN 60749-18:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

€63.00

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UNE-EN 60749-17:2003

UNE-EN 60749-17:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

€36.00

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UNE-EN 60749-5:2003

UNE-EN 60749-5:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

€51.00

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UNE-EN 60749-15:2003

UNE-EN 60749-15:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods -- Part 15: Resistance to soldering temperature for through-hole mounted devices

€41.00

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IEC 60749-29:2003

IEC 60749-29:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

€176.00

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NF EN 60749-20, C96-022-20 (11/2003)

NF EN 60749-20, C96-022-20 (11/2003)

Superseded Historical

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 20 : résistance des CMS à boîtier plastique à l'effet combiné de l'humidité et de la chaleur de soudage

€111.67

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BS EN 60269-4:1996

BS EN 60269-4:1996

Superseded Historical

Low-voltage fuses Supplementary requirements for fuse-links the protection of semiconductor devices

€316.00

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IEC 60749-26:2003

IEC 60749-26:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

€88.00

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IEC 60749-27:2003

IEC 60749-27:2003

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

€88.00

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DIN EN 60749-19:2003-10

DIN EN 60749-19:2003-10

Superseded Historical

Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength (IEC 60749-19:2003); German version EN 60749-19:2003 + Corrigendum 2003-06.

€41.78

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