Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test
€69.00
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 60749-29:2003); German version EN 60749-29:2003 + Corrigendum:2004.
€98.32
Semiconductor devices. Mechanical and climatic test methods Latch-up
€269.00
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
€165.00
Semiconductor devices. Mechanical and climatic test methods Power cycling
Semiconductor devices - Mechanical and climatic test methods -- Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat
€75.00
Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
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Semiconductor devices - Part 1: General (IEC 47/1734/CD:2003)
€122.34
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Power electronics for electrical transmission and distribution systems. Testing of thyristor valves for static VAR compensators
€355.00
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 29 : essai de verrouillage
€95.67
Mechanical standardization of semiconductor devices -- Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
€71.00
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability
€176.00
