Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 26 : essai de la sensibilité aux décharges électrostatiques (DES) - Modèle du corps humain (HBM)
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions (IEC 62047-1:2005); German version EN 62047-1:2006.
€105.42
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
€193.00
Test method for measuring whisker growth on tin and tin alloy surface finishes
€231.00
Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS (IEC 47/1857/CD:2006)
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
€88.00
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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Semiconductor devices. Discrete devices Optoelectronic lasers
€269.00
High-voltage switchgear and controlgear Alternating current fused circuit-switchers for rated voltages above 1 kV up to including 52
€355.00
Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Board level drop test method of components for handheld electronicproduc ts
Semiconductor devices. Mechanical and climatic test methods Solderability
Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2005); German version EN 62258-2:2005, text in English.
€157.10
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method of components for handheld electronic products (IEC 47/1824/CD:2005)
€98.32
