Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
€286.00
Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
€231.00
Normalisation mécanique des dispositifs à semiconducteurs - Partie 6-13 : guide de conception pour les supports sans couvercle pour les boîtiers matriciels à billes et à pas fins et les boîtiers matriciels à zone de contact plate et à pas fins (FBGA/FLGA)
€95.67
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer (IEC 47/1969/CD:2008)
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 60749-37:2008); German version EN 60749-37:2008.
€105.42
Semiconductor devices - Mechanical and climatic test methods - Part 37 : board level drop test method using an accelerometer - Dispositifs à semiconducteurs
€111.67
Semiconductor devices. Mechanical and climatic test methods Board level drop method using an accelerometer
€193.00
Constant Current Electromigration Test (IEC 47/1954/CD:2008)
€84.58
Semiconductor devices - Micro-electromechanical devices - Part 8: Strip bending test method for tensile property measurement of thin films (IEC 47/1961/CD:2008)
€98.32
Semiconductor devices - Micro-electromechanical devices - Part 9: Wafer to wafer bonding strength measurement for MEMS (IEC 47/1947/CD:2007)
Semiconductor devices - Micro-electromechanical devices - Part 5: RF MEMS Switches (IEC 47/1928/CD:2007)
€116.64
Time Dependent Dielectric Breakdown Test (TDDB) for Inter-metal layers (IEC 47/1946/CD:2007)
€91.03
Mechanical standardization of semiconductor devices Design guideline open-top-type sockets for fine-pitch ball grid array and land (FBGA/FLGA)
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
€127.00
