IEC 62007-1:2015/AMD1:2022 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€12.00
IEC 60749-37:2022 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
€186.00
IEC 61975:2010/AMD2:2022 Amendment 2 - High-voltage direct current (HVDC) installations - System tests
€23.00
IEC 63287-2:2023 Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
€93.00
IEC 60749-5:2023 Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
€46.00
IEC 60191-2:1966 Mechanical standardization of semiconductor devices. Part 2: Dimensions
€551.00
IEC 60747-9:2019 Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)
€441.00
IEC 60747-14-10:2019 Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
€302.00
IEC 62779-4:2020 Semiconductor devices - Semiconductor interface for human body communication - Part 4: Capsule endoscope
€133.00
IEC 60749-15:2020 Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices
IEC 60749-41:2020 Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
IEC 60749-30:2020 Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
IEC 60749-20:2020 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
€244.00
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS FBAR Filter & Duplexer (IEC 47/1969/CD:2008)
€111.40
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/1583/CDV:2001); German version prEN 60749-15:2001
€41.78
