Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices (IEC 60747-15:2010); German version EN 60747-15:2012.
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 47F/122/CD:2012)
€167.66
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)
Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
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Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes (IEC 47/2122/CDV:2012); German version FprEN 62483:2012
€162.06
Hand-held motor-operated electric tools. Safety Particular requirements for sanders and polishers other than disk type
€193.00
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
€48.00
Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing (IEC 60749-30:2005 + A1:2011); German version EN 60749-30:2005 + A1:2011.
€84.58
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing - Dispositifs à semiconducteurs
€59.33
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 47/2107/CDV:2011); German version EN 60749-27:2006/FprA1:2011
€41.78
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
