Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing; Charged device model (CDM) (IEC 47/1658/CD:2002)
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling (IEC 60749-34:2004); German version EN 60749-34:2004.
€69.91
Time Dependent Dielectric Breakdown Test (TDDB) (IEC 47/1764/CD:2004)
€91.03
Dispositifs à semiconducteurs - Règles pour la gestion de la fin de vie des composants et pour leur remplacement (obsolescence des composants électroniques) - Prescriptions provisoires.
€30.50
Dispositifs à semiconducteurs - Règles pour la gestion de la fin de vie des composants et pour leur remplacement (obsolescence des composants électroniques). Prescriptions provisoires.
€34.00
IEC 60191-2:2025 DB Mechanical standardization of semiconductor devices - Part 2: Dimensions
€441.00
IEC 60749-27:2006/AMD1:2012 Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
€12.00
IEC 60191-2:1966/AMD19:2012 Amendment 19 - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€186.00
IEC 60191-6-22:2012 Mechanical standardization of semiconductor devices - Part 6-22: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fine-pitch Land Grid Array (S-FBGA and S-FLGA)
€133.00
IEC 60749-26:2013 Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
€342.00
IEC 60747-5-5:2007/AMD1:2013 Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
IEC 62483:2013 Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
IEC 60191-4:2013 Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
IEC 60749-42:2014 Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage
€23.00
IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€302.00
