Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
€84.58
Semiconductor devices - Mechanical and climatic test methods - General (IEC 47/1571/CDV:2001); German version prEN 60749-1:2001
€41.78
Dispositifs à semiconducteurs - Lignes directrices génériques concernant la qualification des semiconducteurs - Partie 3 : Lignes directrices pour les plans de qualification de la fiabilité des modules à semiconducteurs de puissance
€116.50
IEC 60747-14-3: Discrete seminconductor devices - Part 14-3: Semiconductor pressure sensors (IEC 47E/132/CDV:1999)
€69.91
International Electrotechnical Vocabulary - Chapter 521: Semiconductor devices and integrated circuits (IEC 60050-521:1984 and IEC 1/1775/CDV:1999)
€134.02
Standard Specification for Gold Wire for Semiconductor Lead Bonding
€72.00
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
€269.00
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
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Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)
