Semiconductor devices - Mechanical and climatic test methods - General (IEC 47/1571/CDV:2001); German version prEN 60749-1:2001
€41.78
Dispositifs à semiconducteurs - Essais mécaniques et climatiques
€114.00
Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
€451.00
Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices (IEC 47/1583/CDV:2001); German version prEN 60749-15:2001
Semiconductor devices - Mechanical and climatic test methods - Part 16: Particle impact noise detection (PIND) test (IEC 47/1584/CDV:2001); German version prEN 60749-16:2001
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation (IEC 47/1588/CDV:2001); German version prEN 60749-17:2001
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionising Radiation (total dose); Test procedure (IEC 47/1589/CDV:2001); German version prEN 60749-18:2001
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength test (IEC 47/1590/CDV:2001); German version prEN 60749-19:2001
Semiconductor devices - Mechanical and climatic test methods - Part 36: Acceleration steady state (IEC 47/1585/CDV:2001); German version prEN 60749-36:2001
Mechanical standardization of semiconductor devices - Part 4 : coding system and classification into forms of package outlines for semiconductor device packages
€34.00
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
€11.00
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
€22.00
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
