31.080.01 : Semiconductor devices in general

25/30510415 DC:2025

25/30510415 DC:2025

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Draft BS EN 63551-5 Semiconductor devices - Detection modules of autonomous land vehicle Part 5: Testing methods performance for ultrasonic

€23.00

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25/30510419 DC:2025

25/30510419 DC:2025

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Draft BS EN 63551-6 Semiconductor devices - Detection modules of autonomous land vehicle Part 6: Testing methods performance for visual imaging

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25/30539990 DC:2025

25/30539990 DC:2025

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Draft BS EN 63364-2 Semiconductor devices - for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors wearable equipment

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25/30544412 DC:2025

25/30544412 DC:2025

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Draft BS EN 60747-5-17 Semiconductor devices Part 5-17: Optoelectronic - Light emitting diode Measuring methods of optoelectronic parameters micro scale light array

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25/30511310 DC:2025

25/30511310 DC:2025

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Draft BS EN 62047-56 Micro-electromechanical devices Part 56. Test method for characteristics of MEMS metal oxide semiconductor (MOS) type gas sensor

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25/30510635 DC:2025

25/30510635 DC:2025

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Draft BS EN 63567-3 Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment Part 3: Nano-scale wafer surface method using UV light

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BS EN IEC 60749-20-1:2026

BS EN IEC 60749-20-1:2026

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Semiconductor devices ? Mechanical and climatic test methods Part 20-1: Handling, packing, labelling shipping of surface-mount sensitive to the combined effect moisture soldering heat

€316.00

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NF EN IEC 60749-23, C96-022-23PR (02/2026)

NF EN IEC 60749-23, C96-022-23PR (02/2026)

Withdrawn Most Recent

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : durée de vie en fonctionnement à haute température

€47.00

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IEC 60747-14-11:2021

IEC 60747-14-11:2021

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IEC 60747-14-11:2021 Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

€186.00

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IEC TR 63378-1:2021

IEC TR 63378-1:2021

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IEC TR 63378-1:2021 Thermal standardization on semiconductor packages - Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages

€133.00

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IEC 60747-5-4:2022

IEC 60747-5-4:2022

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IEC 60747-5-4:2022 Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

€302.00

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IEC 63378-2-1:2024

IEC 63378-2-1:2024

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IEC 63378-2-1:2024 Thermal standardization on semiconductor packages - Part 2-1: 3D thermal simulation models of semiconductor packages for steady-state analysis - Discrete packages

€93.00

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IEC 60747-5-4:2022/AMD1:2024

IEC 60747-5-4:2022/AMD1:2024

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IEC 60747-5-4:2022/AMD1:2024 Amendment 1 - Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

€23.00

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BS EN IEC 63378-6:2026

BS EN IEC 63378-6:2026

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Thermal standardization on semiconductor packages resistance and capacitance model for transient temperature prediction at junction measurement points

€316.00

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NF EN 60747-15, C96-015 (06/2013)

NF EN 60747-15, C96-015 (06/2013)

Superseded Historical

Semiconductor devices - Discrete devices - Part 15 : isolated power semiconductor devices - Dispositifs à semi-conducteurs

€111.67

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