Mechanical standardization of semiconductor devices -- Part 4: Coding system and classification into forms of package outlines for semiconductor device packages.
€69.00
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 2 : méthodes de mesure
€166.33
Dispositifs optoélectroniques à semiconducteurs pour application dans les systèmes à fibres optiques - Partie 1 : valeurs limites et caractéristiques essentielles
€138.00
Bias Life
€22.00
Moisture/reflow sensivity classification for nonhermetic solid state surface mount devices
€127.00
Acoustic microscopy for nonhermetic encapsulated electronic components
€88.00
A procedure for executing SWEAT
€176.00
Failure mechanisms and models for silicon semiconductor devices
€286.00
Guide for the standard probe pad sizes and layouts for wafer-level electrical testing
Standard method for measuring and using the temperature coefficient of resistance to determine the temperature of a metallization line
High temperature storage life
€11.00
Power and temperature cycling
Hermeticity
Semiconductor devices - Mechanical and climatic test methods
€99.00
Semiconductor devices - Part 14-1: Semiconductor sensors - General and classification
€44.00
