Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
€165.00
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress (HAST)
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing; Machine model (MM) (IEC 47/1624/CDV:2002); German version prEN 60749-27:2002
€63.27
Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing; Human body model (HBM) (IEC 47/1623/CDV:2002); German version prEN 60749-26:2002
Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 47/1615/CDV:2002); German version prEN 60749-14:2002
€69.91
Semiconductor devices - Mechanical and climatic test methods - Part 25: Rapid change of temperature (air, air) (IEC 47/1616/CDV:2002); German version prEN 60749-25:2002
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (IEC 47/1625/CDV:2002); German version prEN 60749-29:2002
€91.03
Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996 + A1:2000 + A2:2001); German version EN 60749:1999 + A1:2000 + A2:2001.
€162.06
Accelerated Moisture Resistance - Unbiased HAST
€22.00
Amendment 2 - Mechanical standardization of semiconductor devices - Part 4: Coding system and classification into forms of package outlines for semiconductor device packages
€11.00
Composants et dispositifs actifs en fibres optiques - Normes de boîtier et d'interface - Partie 1 : généralités et lignes directrices
€59.33
Mechanical standardization of semiconductor devices - Part 6-12: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Design guide for fine-pitch land grid array (FLGA) - Rectangular type
€127.00
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady state temperature humidity bias life test (IEC 47/1600/CDV:2002); German version prEN 60749-5:2002
€48.79
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (IEC 47/1591/CD:2001)
€84.58
