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24/30499009 DC:2024
BS IEC 63581-1 Semiconductor devices - The recognition criteria of defects in polished indium phosphide wafers Part 1: Classification
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/16/2024 |
| Page Count | 31 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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01/04/1996
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08/08/2024
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