Semiconductor devices - Semiconductor interface for human body communication - Part 2: Characterization of interfacing performances
€127.00
Semiconductor devices - Semiconductor interface for human body communication - Part 1: General requirements
Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures
€231.00
Semiconductor devices - Micro-electromechanical devices - Part 1: Terms and definitions
€286.00
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods (IEC 62047-16:2015); German version EN 62047-16:2015
€84.58
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17:2015); German version EN 62047-17:2015
€111.40
Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
€77.96
Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films - Dispositifs à semiconducteurs
€126.10
Semiconductor optoelectronic devices for fibre optic system applications - Part 1 : specification template for essential ratings and characteristics
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
€193.00
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
€316.00
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage (IEC 60749-42:2014); German version EN 60749-42:2014
€63.27
Semiconductor devices Discrete devices: Signal, switching and regulator diodes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes (IEC 62047-20:2014); German version EN 62047-20:2014
€157.10
