Semiconductor devices - Mechanical and climatic test methods - Part 9 : permanence of marking
€77.96
Composants électroniques - Stockage de longue durée des dispositifs électroniques à semiconducteurs - Partie 5 - dispositifs de puces et plaquettes
€111.96
Semiconductor devices. devices for energy harvesting and generation Vibration based electromagnetic
€269.00
Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates
€88.00
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (IEC 60749-44:2016); German version EN 60749-44:2016
€105.42
Semiconductor devices - Micro-electromechanical devices - Part 25: Silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area (IEC 62047-25:2016); German version EN 62047-25:2016
High-voltage direct current (HVDC) installations - System tests
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting
€176.00
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 1: Vibration based piezoelectric energy harvesting
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
€22.00
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination
Amendment 2 - Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
€825.00
