Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
€127.00
Amendment 1 - International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
€11.00
Semiconductor devices - Stress migration test standard - Part 1: Copper stress migration test standard
€176.00
Amendment 2 - Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
€545.00
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
€451.00
Semiconductor devices. devices for energy harvesting and generation Thermo power based thermoelectric
€193.00
Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
€77.96
Semiconductor devices - Mechanical and climatic test methods - Part 5 : steady-state temperature humidity bias life test
Electronic components - Long-term storage of electronic semiconductor devices - Part 1 : general
€107.66
Electronic components - Long-term storage of electronic semiconductor devices - Part 2 : deterioration mechanisms
€111.96
Semiconductor devices - Mechanical and climatic test methods - Part 3 : external visual examination
€52.13
Semiconductor devices - Mechanical and climatic test methods - Part 4 : Damp Heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices - Mechanical and climatic test methods - Part 6 : storage at high temperature
€37.66
