31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
DIN EN 62047-21:2015-04

DIN EN 62047-21:2015-04

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Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014

€91.03

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DIN EN 62047-22:2015-04

DIN EN 62047-22:2015-04

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Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014

€77.20

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IEC 62007-1:2015

IEC 62007-1:2015

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Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics

€286.00

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IEC 62047-17:2015

IEC 62047-17:2015

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Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

€231.00

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IEC 62047-16:2015

IEC 62047-16:2015

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Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods

€44.00

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NF EN 60749-42, C96-022-42 (03/2015)

NF EN 60749-42, C96-022-42 (03/2015)

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Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage - Dispositifs à semiconducteurs

€77.96

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NF EN 62047-22, C96-050-22 (12/2014)

NF EN 62047-22, C96-050-22 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs

€95.67

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NF EN 62047-21, C96-050-21 (12/2014)

NF EN 62047-21, C96-050-21 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs

€95.67

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NF EN 62047-20, C96-050-20 (12/2014)

NF EN 62047-20, C96-050-20 (12/2014)

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Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes

€166.54

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NF EN 62504, C71-504 (12/2014)

NF EN 62504, C71-504 (12/2014)

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General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Éclairage général

€111.96

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PD CLC/TR 62258-4:2013

PD CLC/TR 62258-4:2013

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Semiconductor die products Questionnaire for users and suppliers

€316.00

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BS EN 62047-20:2014

BS EN 62047-20:2014

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Semiconductor devices. Micro-electromechanical devices Gyroscopes

€374.00

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BS EN 62047-21:2014

BS EN 62047-21:2014

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Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials

€193.00

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BS EN 62047-22:2014

BS EN 62047-22:2014

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Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

€165.00

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BS EN 60749-42:2014

BS EN 60749-42:2014

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Semiconductor devices. Mechanical and climatic test methods Temperature humidity storage

€165.00

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