Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials (IEC 62047-21:2014); German version EN 62047-21:2014
€91.03
Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates (IEC 62047-22:2014); German version EN 62047-22:2014
€77.20
Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
€286.00
Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
€231.00
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
€44.00
Semiconductor devices - Mechanical and climatic test methods - Part 42 : temperature humidity storage - Dispositifs à semiconducteurs
€77.96
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
€166.54
General lighting - Light emitting diode (LED) products and related equipment - Terms and definitions - Éclairage général
€111.96
Semiconductor die products Questionnaire for users and suppliers
€316.00
Semiconductor devices. Micro-electromechanical devices Gyroscopes
€374.00
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
€193.00
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
€165.00
Semiconductor devices. Mechanical and climatic test methods Temperature humidity storage