Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/write static memories silicon monolithic circuits
€63.27
Harmonized system of quality assessment for electronic components; blank detail specification: MOS read/wirte dynamic memories silicon monolithic circuits
€69.91
Harmonized system of quality assessment for electronic components; blank detail specification: integrated line transmitters and/or receivers
IEC quality assessment system for electronic compounts; blank detail specification: integrated film and hybrid circuits; qualification approval procedure; identical with IEC 47A(Central Office)182
€41.78
IEC quality assessment system for electronic components; blank detail specification: integrated digital C MOS circuits, series 4000 B and 4000 UB; identical with IEC 47/47A(Central Office)1051/175
Semiconductor devices; discrete devices and integrated circuits; general; identical with IEC 60747-1, edition 1983
€105.42
IEC quality assessment system for electronic components; blank detail specification for bipolar digital monolithic integrated circuit gates; Identical with IEC 47/47A(Central Office)987/151
€48.79
IEC quality assessment system for electronic components; blank detail spezification for programmable bipolar read-only memories; identical with IEC 47/47A(Central Office)989/153
€56.17
Harmonized system of quality assessment for electronic components; blank detail specification; integrated analogue switching circuits
Harmonized system of quality assessement for electronic components; blank detail specification: integrated voltage comparators
Harmonized system of quality assessment for electronic components; sectional specification: film and hybrid integrated circuits (capability approval)
€116.64
Semiconductor devices; integrated circuits; part 1: general; identical with IEC 60748-1, edition 1984
Amendments to the generic specification for semiconductor devices and integrated circuits
€34.30
Amendments to the generic specification for semiconductor devices and integrated circuits; sampling requirements for small lots
Electrical measuring methods for integrated circuits; chip select access time
