IEEE Standard for Test Access Port and Boundary-Scan Architecture
€310.00
Family Specification : Digital Integrated TTL Circuits - Series 54, 64, 74, 84 - Spécification de famille : circuits intégrés digitaux TTL
€111.67
Family Specification : TTL Schottky Digital Integrated Circuits - Series 54S, 64S, 74S, 84S - Spécification de famille : circuits intégrés logiques TTL Schottky
€95.67
Generic Specification : monolithic integrated circuits
€333.00
Family Specification : TTL Advanced Schottky Digital Integrated Circuits - Series 54AS, 74AS - Spécification de famille : circuits intégrés logiques TTL Schottky avancée
Family specification : Digital Integrated HC MOS Circuits - Series HC/HCT/HCU
€153.00
Blank Detail Specification : Digital Microprocessor Integrated Circuits
Family specification : AC MOS Digital Integrated Circuits
€126.00
Family Specification : TTL FAST Digital Integrated Circuits - Series 54F, 74F - Spécification de famille : circuits intégrés logiques TTL FAST
Sectional specification : digital monolithic integrated circuits
€184.00
Family Specification : digital Integrated TTL Low Power Schottky Circuits - Series 54LS, 64LS, 74LS, 84LS - Spécification de famille : circuits intégrés digitaux TTL low power Schottky
Family specification : TTL Advanced Low Power Schottky Digital Integrated Circuits - Series 54ALS, 74ALS
Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)
€63.27
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
€176.00
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
€170.00