Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
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Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
IEEE Standard for Design and Verification of Low-Power, Energy-Aware Electronic Systems
€341.00
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 47E/522/CD:2015)
€48.79
IEEE Standard Format for LSI-Package-Board Interoperable Design
€201.00
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
IEEE/IEC International Standard - Design and Verification of Low-Power Integrated Circuits
€313.00
Film and hybrid integrated circuits - Part 5 : procedure for qualification approval
€126.00
IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device
€275.00
IEEE Standard for Design and Verification of Low-Power Integrated Circuits--Amendment 1
€75.00
Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 47/2172/CD:2013)
€116.64
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013)
€84.58
Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die & Wafer Devices (IEC 47/2174/CD:2013)
Modèles de circuits intégrés pour la CEM - Partie 2 : modèles de circuits intégrés pour la simulation du comportement lors de perturbations électromagnétiques - Modélisation des émissions conduites (ICEM-CE)
€166.33
IEEE Standard for Design and Verification of Low-Power Integrated Circuits
€417.00
