Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 47A/839/CD:2010)
€122.34
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
€311.00
EMC IC modelling Models of integrated circuits for EMI behavioural simulation. Conducted emissions (ICEM-CE)
€355.00
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009); German version EN 60747-16-3:2002 + A1:2009.
€145.14
Semiconductor die products - Part 2: Exchange data formats (IEC 47/2023/CDV:2009); English version FprEN 62258-2:2009
€185.05
Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)
€105.42
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC Stripline method (IEC 47A/810/CD:2009)
IEEE Standard for Design and Verification of Low Power Integrated Circuits
€138.00
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
€325.00
Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC 47/1950/CD:2008)
€173.74
Integrated circuits - Measurement of electromagnetic immunity, 150 KHz to 1 GHz - Part 3 : Bulk Current Injection (BCI) method - Circuits intégrés
€95.67
IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
€347.00
Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 47E/335/CD:2007)
€41.78
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method
€127.00
Mobile ion tests - Bias temperature stress (BTS) - Triangular voltage sweep (TVS) (IEC 47/1904/CD:2007)
€63.27
