31.200 : Integrated circuits. Microelectronics

DIN IEC 62404:2005-02

DIN IEC 62404:2005-02

Withdrawn Most Recent

Integrated Circuits - I/0 Interface Model for Integrated Circuits (IMIC) (IEC 47A/704/CD:2004)

€162.06

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ASTM E1855-04e1

ASTM E1855-04e1

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

This product is not for sale, please contact us for more information

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ASTM E1855-04

ASTM E1855-04

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

This product is not for sale, please contact us for more information

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DIN IEC 62258-3:2004-06

DIN IEC 62258-3:2004-06

Superseded Historical

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC 47/1750/CD:2004)

€140.00

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DIN EN 61967-4/A1:2004-05

DIN EN 61967-4/A1:2004-05

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ohm/150 Ohm direct coupling method (IEC 47A/693/CDV:2004); German version EN 61967-4:2002/prA1:2004

€48.79

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IEEE/IEC 62265:2005

IEEE/IEC 62265:2005

Withdrawn Most Recent

IEC/IEEE International Standard - Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks

€367.00

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IEEE 1603:2003

IEEE 1603:2003

Withdrawn Most Recent

IEEE Standard for an Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks

€367.00

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DIN IEC 61967-3:2003-12

DIN IEC 61967-3:2003-12

Withdrawn Most Recent

Integrated circuits - Measurement of electromagnetic emissions; 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method (IEC 47A/674/CD:2003)

€105.42

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DIN IEC 61967-2:2003-12

DIN IEC 61967-2:2003-12

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM-cell method (IEC 47A/673/CD:2003)

€105.42

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DIN IEC 62132-3:2003-09

DIN IEC 62132-3:2003-09

Superseded Historical

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk Current Injection (BCI), 10 kHz to 1 GHz (IEC 47A/670/CD:2003)

€84.58

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DIN IEC 60748-4-3:2003-09

DIN IEC 60748-4-3:2003-09

Withdrawn Most Recent

Semiconductors devices - Integrated circuits - Part 4-3: Interface integrated circuits; Dynamic criteria for Analogue-Digital Converters (ADC) (IEC 47A/667/CD:2003)

€111.40

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NF EN 62090, C90-530 (08/2003)

NF EN 62090, C90-530 (08/2003)

Superseded Historical

Étiquettes d'emballage de produits pour composants électroniques, utilisant un code à barres et une symbologie bidimensionnelle

€153.00

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DIN EN 61967-6:2003-05

DIN EN 61967-6:2003-05

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method (IEC 61967-6:2002); German version EN 61967-6:2002.

€105.42

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BS EN 62090:2003

BS EN 62090:2003

Superseded Historical

Product package labels for electronic components using bar code and two-dimensional symbologies

€355.00

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IEC 61967-5:2003

IEC 61967-5:2003

Withdrawn Most Recent

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

€176.00

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