Semiconductor devices and integrated circuits; noise, terms and definitions
€24.39
Electrical measuring methods for integrated circuits; verification of the function
Electrical measuring methods for integrated circuits; breakdown voltage U
€34.30
Electrical measuring methods for integrated circuits; output current
Electrical measuring methods for integrated circuits; retrigger time t
IEC quality assessment system for electronic components; blank detail specification: integrated circuit static read/write memories; identical with IEC 47/47A(Central Office)988/152
€56.17
Harmonized system of quality assessment for electronic components; blank detail specification: film and hybrid integrated circuits (capability approval)
€41.78
Harmonized system of quality assessment for electronic components; basic specification: scanning electron microscope inspection of semiconductor dice
€69.91
Harmonized system of quality assessment for electronic components; basic specification: radiographic inspection of electronic components
€48.79
Digital circuits; measuring method for output enable (disable) time (for three-state outputs)
Integrated analogue circuits; additional methods of measurement for analogue switching circuits, static on-state resistance and harmonic distortion; identical with IEC 47A(Central Office)149
Semiconductor devices and integrated circuits; terms and definitions; amendments and supplements to IEC 60747-1 and IEC 60747-7; identical with IEC 47(Central Office)981
Semiconductor devices and integrated circuits; additional characteristic for digital integrated circuits having three-state outputs; identical with IEC 47A(Central Office)150
Harmonized system of quality assessment for electronic components; family specification: digital integrated TTL-Low Power Schottky circuits; series 54 LS, 64 LS, 74 LS, 84 LS
€77.20
Harmonized system of quality assessment for electronic components; generic specification: film and hybrid integrated circuits
€84.58
