Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
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Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
€404.00
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz conducted emissions. Ohm/150 Ohm direct coupling method. Application guidance IEC 61967-4
€355.00
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
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Mnemonics and symbols for integrated circuits
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Integrated circuits. Measurement of electromagnetic immunity, 150 kHz to 1 GHz Workbench Faraday cage method
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic immunity radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
Integrated circuits. Measurement of electromagnetic emissions radiated emissions. Surface scan method
€316.00
Product package labels for electronic components using bar code and two- dimensional symbologies
Format for LSI-Package-Board interoperable design
