31.200 : Integrated circuits. Microelectronics

IEC 61967-4:2021

IEC 61967-4:2021

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Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

€325.00

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21/30433680 DC:2021

21/30433680 DC:2021

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BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI

€23.00

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ANSI/VITA 88.0-2021

ANSI/VITA 88.0-2021

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Switched Mezzanine Card Plus (XMC+) Standard

€55.00

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ANSI/VITA 68.2:2021

ANSI/VITA 68.2:2021

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VPX Standard S-Parameter Definition

€27.50

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BS EN IEC 62433-6:2020

BS EN IEC 62433-6:2020

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EMC IC modelling Models of integrated circuits for Pulse immunity behavioural simulation. Conducted Immunity (ICIM-CPI)

€374.00

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NF EN IEC 62433-6, C96-070-6 (11/2020)

NF EN IEC 62433-6, C96-070-6 (11/2020)

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EMC IC modelling - Part 6 : models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI) - Modèles de circuits intégrés pour la CEM - Partie 6 : Modèles de circuits intégrés pour la simulation du comportement d'immunité aux impulsions - Modélisation de l'immunité aux impulsions conduite (ICIMCPI)

€184.00

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IEC 62433-6:2020

IEC 62433-6:2020

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EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

€369.00

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NF EN 60747-16-5/A1, C96-016-5/A1 (09/2020)

NF EN 60747-16-5/A1, C96-016-5/A1 (09/2020)

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Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators

€59.33

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20/30426553 DC:2020

20/30426553 DC:2020

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BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI

€23.00

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BS EN IEC 62433-1:2019

BS EN IEC 62433-1:2019

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EMC IC modelling General framework

€374.00

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IEC 62433-1:2019/COR1:2020

IEC 62433-1:2019/COR1:2020

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Corrigendum 1 - EMC IC modelling - Part 1: General modelling framework

€0.00

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IEEE 1481:2019

IEEE 1481:2019

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IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)

€354.00

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IEEE 1838:2019

IEEE 1838:2019

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IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits

€101.00

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ASTM E1855-20

ASTM E1855-20

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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

€65.00

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IEEE 2401:2019

IEEE 2401:2019

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IEEE Standard Format for LSI-Package-Board Interoperable Design

€200.00

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