31.200 : Integrated circuits. Microelectronics

BS EN 61967-8:2011

BS EN 61967-8:2011

Superseded Historical

Integrated circuits. Measurement of electromagnetic emissions radiated emissions. IC stripline method

€193.00

View more
IEC 61967-8:2011

IEC 61967-8:2011

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

€127.00

View more
BS EN 61386-23:2004+A11:2010

BS EN 61386-23:2004+A11:2010

Superseded Historical

Conduit systems for cable management Particular requirements. Flexible conduit

€193.00

View more
DD IEC/TS 62433-1:2011

DD IEC/TS 62433-1:2011

Superseded Historical

EMC IC modelling General framework

€193.00

View more
IEEE 1581:2011

IEEE 1581:2011

Withdrawn Most Recent

IEEE Standard for Static Component Interconnection Test Protocol and Architecture

€106.00

View more
IEC TS 62433-1:2011

IEC TS 62433-1:2011

Superseded Historical

EMC IC modelling - Part 1: General modelling framework

€44.00

View more
IEEE 1241:2010

IEEE 1241:2010

Withdrawn Most Recent

IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters

€184.00

View more
ASTM E1855-10

ASTM E1855-10

Superseded Historical

Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors

This product is not for sale, please contact us for more information

View more
PD IEC/TR 61967-1-1:2010

PD IEC/TR 61967-1-1:2010

Superseded Historical

Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format

€374.00

View more
IEEE 605a:2010

IEEE 605a:2010

Withdrawn Most Recent

IEEE Guide for Bus Design in Air-Insulated Substations—Amendment 1

€71.00

View more
IEEE 605:2008

IEEE 605:2008

Withdrawn Most Recent

IEEE Guide for Bus Design in Air Insulated Substations

€92.00

View more
IEC TR 61967-1-1:2010

IEC TR 61967-1-1:2010

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

€369.00

View more
ASTM F744M-10

ASTM F744M-10

Superseded Historical

Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]

This product is not for sale, please contact us for more information

View more
ASTM F773M-10

ASTM F773M-10

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]

This product is not for sale, please contact us for more information

View more
DIN EN 62433-2:2010-05

DIN EN 62433-2:2010-05

Superseded Historical

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2008); German version EN 62433-2:2010.

€140.00

View more