Superseded
Standard
Historical
IEC 61967-4:2002+AMD1:2006 Consolidated
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 O/150 O direct coupling method
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Summary
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 O resistive probe and RF voltage measurement using a 150 O coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods. The contents of the corrigendum 1 of June 2017 have been included in this copy.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
This consolidated version consists of the first edition (2002) and its amendment 1 (2006). Therefore, no need to order amendment in addition to this publication.
Notes
Combine CEI 61967-4 (2002-04) et AMD 1 (2006-02)
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 07/27/2006 |
| Release Date | 07/27/2006 |
| Cancellation Date | 03/16/2021 |
| Edition | 1.1 |
| Page Count | 65 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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