Normadoc

NF EN 62047-18, C96-050-18 (02/2014)

Active Most Recent

Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs

€95.67

ASTM D6095-12(2023)

Active Most Recent

Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials

€58.00

NF EN 62047-9, C96-050-9 (04/2012)

Active Most Recent

Semiconductor devices - Micro-electromechanical devices - Part 9 : wafer to wafer bonding strength measurement for MEMS - Dispositifs à semiconducteurs

€93.67

ASTM E1438-11(2019)

Active Most Recent

Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS

€58.00

NF EN 62047-4 (09/2011)

Active Most Recent

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 4 : spécification générique pour les MEMS

€82.00

NF EN 62047-6, C96-050-6 (09/2010)

Active Most Recent

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 6 : méthodes d'essais de fatigue axiale des matériaux en couche mince

€95.67

DIN 50455-1:2009-10

Active Most Recent

Testing of materials for semiconductor technology - Methods for characterizing photoresists - Part 1: Determination of coating thickness with optical methods

€41.78

DIN 50452-2:2009-10

Active Most Recent

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 2: Determination of particles by optical particle counters

€56.17

ASTM D3004-08(2020)

Active Most Recent

Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor, and Insulation Shielding Materials

€58.00

NF EN 62047-2, C96-050-2 (11/2006)

Active Most Recent

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 2 : méthodes d'essais de traction des matériaux en couche mince

€77.67

NF EN 62047-3, C96-050-3 (11/2006)

Active Most Recent

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 3 : éprouvettes d'essai normalisée en couche mince pour l'essai de traction

€59.33

BS EN 62226-2-1:2005

Active Most Recent

Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating current density internal field induced human body 2D models

€374.00

DIN 50455-2:1999-11

Active Most Recent

Testing of materials for semiconductor technology - Methods for the characterisation photoresists - Part 2: Determination of photosensitivity of positive photoresists

€34.30

DIN 50452-1:1995-11

Active Most Recent

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 1: Microscopic determination of particles

€34.30

DIN 50452-3:1995-10

Active Most Recent

Testing of materials for semiconductor technology - Test method for particle analysis in liquids - Part 3: Calibration of optical particle counters

€41.78

Previous
1
2
3 (current)
4
5
6
7
…
20
Next

29.045 : Semiconducting materials

NF EN 62047-18, C96-050-18 (02/2014)

ASTM D6095-12(2023)

NF EN 62047-9, C96-050-9 (04/2012)

ASTM E1438-11(2019)

NF EN 62047-4 (09/2011)

NF EN 62047-6, C96-050-6 (09/2010)

DIN 50455-1:2009-10

DIN 50452-2:2009-10

ASTM D3004-08(2020)

NF EN 62047-2, C96-050-2 (11/2006)

NF EN 62047-3, C96-050-3 (11/2006)

BS EN 62226-2-1:2005

DIN 50455-2:1999-11

DIN 50452-1:1995-11

DIN 50452-3:1995-10