31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
BS 9364 N008 and N010:1978

BS 9364 N008 and N010:1978

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

€165.00

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BS 9364 N011:1978

BS 9364 N011:1978

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€165.00

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BS 9364 N012:1978

BS 9364 N012:1978

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

€165.00

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IEEE 581:1978

IEEE 581:1978

Withdrawn Most Recent

IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors

€51.00

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UTE C86-812/A1, C86-812/A1U (03/1978)

UTE C86-812/A1, C86-812/A1U (03/1978)

Withdrawn Most Recent

Additif 1 à la publication UTE C 86-812 de juin 1976

€95.67

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BS EN 150012:1993

BS EN 150012:1993

Withdrawn Most Recent

Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors

€355.00

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IEC 60191-2G:1978

IEC 60191-2G:1978

Withdrawn Most Recent

Seventh supplement

€22.00

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IEC 60191-2H:1978

IEC 60191-2H:1978

Withdrawn Most Recent

Eigth supplement

€22.00

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IEC 60147-2J:1978

IEC 60147-2J:1978

Superseded Historical

Supplement J - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Chapter 7: Analogue integrated circuits

€369.00

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IEC 60147-2K:1978

IEC 60147-2K:1978

Withdrawn Most Recent

Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods

€231.00

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IEC 60191-3B:1978

IEC 60191-3B:1978

Superseded Historical

Mechanical standardization of semiconductor devices - Part 3: General rules for the preparation of outline drawings of integrated circuits - Second supplement

€22.00

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DIN 45953-2*CECC 50002:1977-12

DIN 45953-2*CECC 50002:1977-12

Withdrawn Most Recent

Harmonized system of quality assessment for electronic components; detail specification: HF-transistor type BFY 90

€34.30

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NF C96-621 (11/1977)

NF C96-621 (11/1977)

Withdrawn Most Recent

Semiconducteurs - Transistors bipolaires en hyperfréquences - Prescriptions générales.

€163.50

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BS 9334:1977

BS 9334:1977

Withdrawn Most Recent

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: rectifier bridges. Ambient rated, single phase, in solid (plastics) encapsulation

€269.00

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BS 9327:1977

BS 9327:1977

Withdrawn Most Recent

Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation)

€165.00

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