Withdrawn
Standard
Most Recent
IEC 60147-2K:1978
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods -
Part 2: General principles of measuring methods
Part 2: General principles of measuring methods
Preview
Summary
Gives an alternative method to that described in IEC 147-2F for measuring the main parameters of varactor diodes by means of a coaxial cavity. Describes the methods of measurement for microwave mixer diodes, i.e. in addition to measurement of d.c. parameters, those of rectified current, intermediate frequency impedance, voltage standing wave ratio, overall noise factor, output noise ratio, conversion loss, burnout energy.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 01/01/1978 |
| Release Date | 01/01/1978 |
| Cancellation Date | 03/31/1995 |
| Edition | 1 |
| Page Count | 55 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
No products.