Composants électroniques - Système CENELEC d'assurance de la qualité - Transistors à effet de champ à grille unique - Spécification particulière cadre (changement de statut de NF C 86-712, juillet 1978, ENR.)
€34.00
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: general purpose semiconductor diodes
€193.00
Additif 2 à la publication UTE C 86-613 de mars 1979
€59.33
Harmonised system of quality assessment for electronic components; detail specification, NF-Transistor type BCY 59
€63.27
Specification for letter symbols for semiconductor devices and integrated microcircuits
€165.00
Supplement D - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics - Chapter 6: Digital integrated circuits
€286.00
Supplement H - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
€231.00
Supplement J - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics
€88.00
Supplement K - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 1: Essential ratings and characteristics - Chapter 9: Optoelectronic devices
Supplement A - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 5: Mechanical and climatic test methods
€176.00
Tenth supplement - Mechanical standardization of semiconductor devices - Part 2: Dimensions
€44.00
Additif 1 à la publication UTE C 86-818 de décembre 1978
Additif 1 à la publication UTE C 86-815 de juin 1977
Additif 1 à la publication UTE C 86-613 de mars 1979
Additif 3 à la publication UTE C 86-812 de juin 1976
