31.080 : Semiconductor devices

31.080.01

Semiconductor devices in general

31.080.10

Diodes

31.080.20

Thyristors

31.080.30

Transistors

31.080.99

Other semiconductor devices
UTE C86-812/A2, C86-812/A2U (04/1979)

UTE C86-812/A2, C86-812/A2U (04/1979)

Withdrawn Most Recent

Additif 2 à la publication UTE C 86-812 de juin 1976

€43.67

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DIN 41790:1979-03

DIN 41790:1979-03

Withdrawn Most Recent

Semiconductor devices - Recommendations for data sheets - Voltage reference and voltage regulator diodes

€24.39

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UTE C86-613, C86-613U (03/1979)

UTE C86-613, C86-613U (03/1979)

Withdrawn Most Recent

Composants électroniques - Transistors bipolaires à température de boîtier spécifiée pour amplification basse fréquence - Recueil de spécifications particulières.

€43.67

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BS 9364 N013:1979

BS 9364 N013:1979

Withdrawn Most Recent

Detail specification for low power silicon p-n-p switching transistors. 25 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€165.00

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BS 9364 N016:1979

BS 9364 N016:1979

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€165.00

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BS 9364 N017:1979

BS 9364 N017:1979

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 65 V, planar epitaxial, ambient rated, hermetic encapsulation (long lead version). Full plus additional assessment level

€165.00

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ASTM F615-79(1988)

ASTM F615-79(1988)

Withdrawn Most Recent

Practice for Determining Safe Current Pulse Operating Regions for Metallization on Semiconductor Components (Withdrawn 1995)

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ASTM F466-79(1992)

ASTM F466-79(1992)

Withdrawn Most Recent

Test Method for Small-Signal Scattering Parameters of Low-Power Transistors in the 0.2 to 2.0 GHZ Frequency Range (Withdrawn 1997)

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BS 9304:1979

BS 9304:1979

Withdrawn Most Recent

Rules for the preparation of detail specifications for semiconductor devices of assessed quality. Voltage reference diodes

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IEC 60147-0E:1979

IEC 60147-0E:1979

Superseded Historical

Supplement E - Essential ratings and characteristics et semiconductor devices and general principles of measuring methods - Part 0: General and terminology

€176.00

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IEC 60147-2L:1979

IEC 60147-2L:1979

Superseded Historical

Supplement L - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Chapter 6: Digital integrated circuits

€286.00

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IEC 60148B:1979

IEC 60148B:1979

Superseded Historical

Supplement B - Letter symbols for semiconductor devices and integrated microcircuits

€44.00

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UTE C96-621, C96-621U (12/1978)

UTE C96-621, C96-621U (12/1978)

Withdrawn Most Recent

Semiconducteurs - Transistors bipolaires en hyperfréquences - Recueil de spécifications particulières.

€86.50

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UTE C86-818, C86-818U (12/1978)

UTE C86-818, C86-818U (12/1978)

Withdrawn Most Recent

Composants électroniques - Diodes de redressement à température ambiante spécifiée - Recueil de spécifications particulières.

€59.33

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BS 9364 N007 and N009:1978

BS 9364 N007 and N009:1978

Withdrawn Most Recent

Detail specification for low power silicon n-p-n switching transistors. 20 V, planar epitaxial, ambient rated, hermetic encapsulation. Full plus additional assessment level

€165.00

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