31.080.99 : Other semiconductor devices

25/30510639 DC:2025

25/30510639 DC:2025

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Draft BS EN 63567-4 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 4. Evaluation methods for dimensional accuracy laser dicing process

€23.00

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PD IEC TR 63571:2025

PD IEC TR 63571:2025

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Semiconductor devices. Estimation method for lifetime conversion from “PART” to “SYSTEM”

€269.00

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IEC TR 63571:2025

IEC TR 63571:2025

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Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”

€176.00

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BS IEC 62047-46:2025

BS IEC 62047-46:2025

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Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of tensile strength nanoscale thickness membrane

€193.00

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IEC 62047-50:2025

IEC 62047-50:2025

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Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

€88.00

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IEC 62047-46:2025

IEC 62047-46:2025

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Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane

€88.00

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BS IEC 62047-45:2025

BS IEC 62047-45:2025

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Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of impact resistance nanostructures

€193.00

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IEC 62047-45:2025

IEC 62047-45:2025

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Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures

€88.00

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25/30508761 DC:2025

25/30508761 DC:2025

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BS EN IEC 60747-5-13/AMD1 Amendment 1 - Semiconductor devices Part 5-13: Optoelectronic Hydrogen sulphide corrosion test for LED packages

€23.00

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25/30509883 DC:2025

25/30509883 DC:2025

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Draft BS EN 63608-1 Semiconductor devices - Reliability evaluation methods for vibration energy harvesters Part 1: Mechanical reliability under shock

€23.00

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25/30507934 DC:2025

25/30507934 DC:2025

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BS EN IEC 60747-5-19 Semiconductor devices Part 5-19: Optoelectronic - Light emitting diodes Test method of the micro photoluminescence for chip wafers light

€23.00

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BS EN IEC 60747-15:2024

BS EN IEC 60747-15:2024

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Semiconductor devices Discrete devices. Isolated power semiconductor

€374.00

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24/30505492 DC:2024

24/30505492 DC:2024

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BS EN IEC 62047-51 Semiconductor Devices - Micro-electromechanical Part 51: Test method of electrical characteristics under two-directional cyclic bending deformation for flexible microelectromechanical devices

€23.00

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BS EN IEC 60747-16-9:2024

BS EN IEC 60747-16-9:2024

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Semiconductor devices Microwave integrated circuits. Phase shifters

€316.00

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NF EN IEC 60747-16-9, C96-016-9 (11/2024)

NF EN IEC 60747-16-9, C96-016-9 (11/2024)

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Dispositifs à semiconducteurs - Partie 16-9 : circuits intégrés hyperfréquences - Déphaseurs

€138.00

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