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IEC TR 63571:2025
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
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Summary
IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.
Technical characteristics
| Publisher | International Electrotechnical Commission (IEC) |
| Publication Date | 05/13/2025 |
| Release Date | 05/13/2025 |
| Edition | 1 |
| Page Count | 24 |
| Themes | Quality assurance |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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