BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
€23.00
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
€269.00
BS IEC 62047-48. Semiconductor devices. Micro-electromechanical devices Part 48. Test method of determining solution concentration by optical absorption using MEMS fluidic device
Semiconductor devices. devices for energy harvesting and generation Linear sliding mode triboelectric
€316.00
BS EN IEC 60747-15. Semiconductor devices Part 15. Isolated power semiconductor devices. Discrete
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
€42.00
Semiconductor devices Microwave integrated circuits. Attenuators
€355.00
Semiconductor devices Microwave integrated circuits. Limiters
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
€193.00
BS EN IEC 62047-45. Semiconductor devices. Micro-electromechanical devices Part 45. Silicon based MEMS fabrication technology. Measurement method of impact resistance nanostructures
BS EN IEC 62047-46. Semiconductor devices. Micro-electromechanical devices Part 46. Silicon based MEMS fabrication technology. Measurement method of tensile strength nanoscale membrane
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary random mechanical vibrations
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage GaN-based light diodes based on photocurrent spectroscopy
€183.00
