Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration MEMS structures
€316.00
Semiconductor devices Smart sensors. Control scheme of smart sensors
€269.00
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
€404.00
Semiconductor devices. devices for energy harvesting and generation Linear sliding mode triboelectric
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using photoluminescence
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
€193.00
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application
€23.00
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
Semiconductor devices. Discrete devices Isolated power semiconductor
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
€165.00
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices Microwave integrated circuits. Attenuators
€355.00
