BS EN IEC 62047-53 Semiconductor devices. Micro-electromechanical devices Part 53. MEMS electrothermal transfer device
€23.00
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
€42.00
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
€193.00
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
BS EN IEC 62031 LED modules. Safety requirements
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
BS IEC 60747-5-18 Semiconductor devices Part 5-18: Optoelectronic - Light emitting diodes Test method light diodesof the macro photoluminescence for epitaxial wafers of micro
BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 5. Test method using X-ray topography
BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 1. Transmittance method EUV pellicle
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (c.w. operation)
€269.00
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (c.w. operation)
€165.00
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave avalanche oscillators (pulse operation)
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave semiconductor switches (without integrated driver circuits)
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor
