Rules for the preparation of detail specifications for semiconductor devices of assessed quality: microwave Gunn oscillators (pulse operation)
€165.00
Rules for the preparation of detail specifications for semiconductor devices of assessed quality: rectifier bridges. Ambient rated, single phase, in solid (plastics) encapsulation
€269.00
Semiconductor devices - Micro-electromechanical devices - Part 1 : terms and definitions
€98.42
Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
€77.67
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 19 : compas électroniques
€126.00
Semiconductor devices - Micro-electromechanical devices - Part 22 : electromechanical tensile test method for conductive thin films on flexible substrates - Dispositifs à semiconducteurs
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 21 : test method for Poisson's ratio of thin film MEMS materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 20 : gyroscopes
€166.33
Semiconductor devices - Micro-electromechanical devices - Part 14 : forming limit measuring method of metallic film materials - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 13 : bend - and shear - type test methods of measuring adhesive strenght for MEMS structures - Dispositifs à semiconducteurs
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials - Dispositifs à semiconducteurs
Semiconductor devices - Part 16-4 : microwave integrated circuits - Switches
€101.00
€153.00
Semiconductor devices - Part 16-3 : microwave integrated circuits - Frequency converters
€125.00
Semiconductor devices - Micro-electromechanical devices - Part 11 : test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems - Dispositifs à semiconducteurs
