Semiconductor devices - Micro-electromechanical devices - Part 10 : micro-pillar compression test for MEMS materials - Dispositifs à semiconducteur
€77.67
Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
€138.00
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 8 : méthode d'essai de la flexion de bandes en vue de la mesure des propriétés de traction des couches minces
€95.67
Semiconductor devices - Micro-electromechanical devices - Part 16 : test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
Semiconductor devices - Micro-electromechanical devices - Part 26 : description and measurement methods for micro trench and needle structures
€93.67
Semiconductor devices - Micro-electromechanical devices - Part 25 : silicon based MEMS fabrication technology - Measurement method of pull-press and shearing strength of micro bonding area
€111.67
Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
IEC 822 VSB. Parallel sub-system bus of the IEC 821 VMEBUS.
€252.67
Semiconductor devices - Part 16-6 : microwave integrated circuits - Frequency multipliers
€116.50
Semiconductor devices - Part 17 : magnetic and capacitive coupler for basic and reinforced insulation
€166.33
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/374/CD:2008)
€134.02
Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007.
€145.14
Dispositifs à semiconducteurs - Partie 16-7 : circuits intégrés hyperfréquences - Atténuateurs
€153.00
Dispositifs à semiconducteurs - Partie 16-8 : circuits intégrés hyperfréquences - Limiteurs
Semiconductor devices - Micro-electromechanical devices - Part 17 : bulge test method for measuring mechanical properties of thin films - Dispositifs à semiconducteurs
€126.00
