31.080.99 : Other semiconductor devices

IEC 62830-4:2019

IEC 62830-4:2019

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Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices

€286.00

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BS IEC 63068-2:2019

BS IEC 63068-2:2019

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Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method using optical inspection

€269.00

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IEC 63068-1:2019

IEC 63068-1:2019

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IEC 63068-1:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects

€176.00

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IEC 63068-2:2019

IEC 63068-2:2019

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IEC 63068-2:2019 Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection

€176.00

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BS IEC 62047-32:2019

BS IEC 62047-32:2019

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Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators

€193.00

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IEC 62047-32:2019

IEC 62047-32:2019

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Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators

€127.00

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IEC 60050-523:2018

IEC 60050-523:2018

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International Electrotechnical Vocabulary (IEV) - Part 523: Micro-electromechanical devices

€176.00

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18/30383935 DC:2018

18/30383935 DC:2018

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BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application

€23.00

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BS IEC 62951-3:2018

BS IEC 62951-3:2018

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Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging

€269.00

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IEC 62951-3:2018

IEC 62951-3:2018

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Semiconductor devices - Flexible and stretchable semiconductor devices - Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

€176.00

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BS EN IEC 62969-4:2018

BS EN IEC 62969-4:2018

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Semiconductor devices. interface for automotive vehicles Evaluation method of data vehicle sensors

€269.00

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NF EN IEC 62969-4 (08/2018)

NF EN IEC 62969-4 (08/2018)

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Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 4 : méthode d’évaluation de l’interface de données destinée aux capteurs de véhicules automobiles

€82.00

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BS EN IEC 62969-3:2018

BS EN IEC 62969-3:2018

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Semiconductor devices. interface for automotive vehicles Shock driven piezoelectric energy harvesting vehicle sensors

€269.00

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IEC 62969-4:2018

IEC 62969-4:2018

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Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors

€127.00

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NF EN IEC 62969-3 (06/2018)

NF EN IEC 62969-3 (06/2018)

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Dispositifs à semiconducteurs - Interface à semiconducteurs pour les véhicules automobiles - Partie 3 : récupération de l’énergie piézoélectrique produite par les chocs pour les capteurs de véhicules automobiles

€82.00

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