Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion (IEC 47/2758/CD:2022); Text in German and English
€111.40
BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 5. Test method using X-ray topography
€23.00
BS EN IEC 63567-1 Semiconductor devices. Performance evaluation of semiconductor processing components and inspection equipment Part 1. Transmittance method EUV pellicle
Semiconductor devices. Micro-electromechanical devices Test method for determining solution concentration by optical absorption using MEMS fluidic device
€193.00
Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
€88.00
BS EN IEC 62031 LED modules. Safety requirements
Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 60747-16-8:2022); German version EN IEC 60747-16-8:2023
€128.22
Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 60747-16-7:2022); German version EN IEC 60747-16-7:2023
€140.00
BS IEC 60747-5-18 Semiconductor devices Part 5-18: Optoelectronic - Light emitting diodes Test method light diodesof the macro photoluminescence for epitaxial wafers of micro
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical
Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
€127.00
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive
€183.00
Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
BS EN IEC 62047-49. Semiconductor devices. Micro-electromechanical devices Part 49. Reliability test methods of electro-mechanical conversion characteristics piezoelectric MEMS cantilever
